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Pore Characterization in Low-k Dielectric Films Using X-Ray Reflectivity: X-Ray Porosimetry

Name: Pore Characterization in Low-k Dielectric Films Using X-Ray Reflectivity: X-Ray Porosimetry
Price: 23.14 EUR
Availability: InStock

Product ID: 287271514

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Pore Characterization in Low-k Dielectric Films Using X-Ray Reflectivity: X-Ray Porosimetry

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Farhan Q.

The delivery time was excellent, and the packaging was secure.

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