--- product_id: 1698756 title: "Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition" price: "€ 188.44" currency: EUR in_stock: true reviews_count: 10 url: https://www.desertcart.gr/products/1698756-scanning-electron-microscopy-and-x-ray-microanalysis-third-edition store_origin: GR region: Greece --- # Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition **Price:** € 188.44 **Availability:** ✅ In Stock ## Quick Answers - **What is this?** Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition - **How much does it cost?** € 188.44 with free shipping - **Is it available?** Yes, in stock and ready to ship - **Where can I buy it?** [www.desertcart.gr](https://www.desertcart.gr/products/1698756-scanning-electron-microscopy-and-x-ray-microanalysis-third-edition) ## Best For - Customers looking for quality international products ## Why This Product - Free international shipping included - Worldwide delivery with tracking - 15-day hassle-free returns ## Description In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The ?eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and “through-the-lens” detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping. Review: Good depth - Very good depth, has everything you'd need to know and more as an end user Review: The Bible of All Scanning Electron Microscopy Books - If you are like me and had to use a Scanning Electron Microscope or SEM, you want to start with the basics that everyone goes by. This book is a safe bet that most everyone knows about. Plus, it is written with very little background in the world of electron microscopy. Too many authors to list but it's wonderful that alot of experts got together to present this material in clear, concise manner. Before you grab your solid-state physics book or check Wikipedia, just relax and page through it since this book pretty much makes it easy for you. Chapters are arranged by the following: What is SEM?, How SEM works?, and Why are we interested with SEM? That's the easiest way to explain rather than list all the chapters. If you have a specific question, you don't even have to read through the previous chapters (if you have rough understanding). The size of this book is a BIG PLUS. It's compact compared to the monsterous Transmission Electron Microscopy (TEM) book by Barry Carter which is another great reference. For this price, you would be lucky to find another good reference book under $100 with such relevant information. ## Technical Specifications | Specification | Value | |---------------|-------| | Best Sellers Rank | #1,394,247 in Books ( See Top 100 in Books ) #23 in Electron Microscopes & Microscopy (Books) #59 in Testing Materials Engineering #645 in Materials Science (Books) | | Customer Reviews | 4.8 out of 5 stars 45 Reviews | ## Images ![Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition - Image 1](https://m.media-amazon.com/images/I/61ibLtckLVL.jpg) ## Customer Reviews ### ⭐⭐⭐⭐⭐ Good depth *by W***S on May 10, 2026* Very good depth, has everything you'd need to know and more as an end user ### ⭐⭐⭐⭐⭐ The Bible of All Scanning Electron Microscopy Books *by P***P on September 20, 2008* If you are like me and had to use a Scanning Electron Microscope or SEM, you want to start with the basics that everyone goes by. This book is a safe bet that most everyone knows about. Plus, it is written with very little background in the world of electron microscopy. Too many authors to list but it's wonderful that alot of experts got together to present this material in clear, concise manner. Before you grab your solid-state physics book or check Wikipedia, just relax and page through it since this book pretty much makes it easy for you. Chapters are arranged by the following: What is SEM?, How SEM works?, and Why are we interested with SEM? That's the easiest way to explain rather than list all the chapters. If you have a specific question, you don't even have to read through the previous chapters (if you have rough understanding). The size of this book is a BIG PLUS. It's compact compared to the monsterous Transmission Electron Microscopy (TEM) book by Barry Carter which is another great reference. For this price, you would be lucky to find another good reference book under $100 with such relevant information. ### ⭐⭐⭐⭐⭐ Excellent so far. *by T***3 on November 12, 2009* I'm reading this book and an older edition of the Reimer text for in independent study course in SEM. While I'm only three chapters into both texts, the Goldstein text seems more readable. I like the writing style, and it doesn't seem to sacrifice in any technical aspect. It is also very well illustrated. For a book about an imaging technology, this is obviously quite important. There are many instances where there are sets of images to compare the results achieved with varied operating parameters. The text is well organized. It begins with an assumption that you know some basic physics and chemistry, but doesn't require any background in microscopy. Both the Table of Contents and Index are detailed enough to enable specific searches for specific subject matter. This is a textbook I look forward to reading in the evening, and one that I look forward to finishing. It matches very well with the practical work I'm doing on the SEM. --- ## Why Shop on Desertcart? - 🛒 **Trusted by 1.3+ Million Shoppers** — Serving international shoppers since 2016 - 🌍 **Shop Globally** — Access 737+ million products across 21 categories - 💰 **No Hidden Fees** — All customs, duties, and taxes included in the price - 🔄 **15-Day Free Returns** — Hassle-free returns (30 days for PRO members) - 🔒 **Secure Payments** — Trusted payment options with buyer protection - ⭐ **TrustPilot Rated 4.5/5** — Based on 8,000+ happy customer reviews **Shop now:** [https://www.desertcart.gr/products/1698756-scanning-electron-microscopy-and-x-ray-microanalysis-third-edition](https://www.desertcart.gr/products/1698756-scanning-electron-microscopy-and-x-ray-microanalysis-third-edition) --- *Product available on Desertcart Greece* *Store origin: GR* *Last updated: 2026-05-28*